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Evolution of Combinational and Sequential On-Line Self-Diagnosing Hardware
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posted on 2023-06-08, 06:36 authored by Miguel Garvie, Adrian ThompsonThe evolution of circuits with on-line built-in self-test is attempted in simulation for a full adder, a two bit multiplier and an edge triggered D-Latch. Results show that evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.
History
Publication status
- Published
Publisher
IEEE Computer SocietyPage range
167-173Pages
7.0Presentation Type
- paper
Event name
NASA/DoD Conference on Evolvable HardwareEvent location
Chicago, USAEvent type
conferenceISBN
0-7695-1977-6Department affiliated with
- Informatics Publications
Notes
Originality: Extends our earlier introduction of evolutionary design for circuits with on-line built-in self-test to practical sequential circuits. Rigour: Full diagnosis achieved for an edge-triggered D-latch, competitive with hand-designed solutions, promise for larger circuits. Signification: Improves the practicality of our novel technique by tackling the considerable challenge presented by sequential circuits: implications throughout electronic self-test. Outlet/citations: This conference achieves good exposure to US space and military scientists. GoogleScholar=4Full text available
- No
Peer reviewed?
- Yes
Editors
J Steincamp, M Ferguson, J Lohn, A Stoica, D Keymeulen, R ZebulumLegacy Posted Date
2012-02-06Usage metrics
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