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Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process
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posted on 2023-06-08, 06:37 authored by C Veerappan, J Richardson, R Walker, D U Li, M W Fishburn, D Stoppa, F Borghetti, Y Maruyama, M Gersbach, R K Henderson, C Bruschini, E CharbonNo description supplied
History
Publication status
- Published
Publisher
IEEE Solid-State Circuits SocietyPresentation Type
- paper
Event name
IEEE 41th European Solid-State Device Research Conference (ESSDERC)Event location
Helsinki, FinlandEvent type
conferenceDepartment affiliated with
- Engineering and Design Publications
Notes
Main author, the first five authors contribute equally.Full text available
- No
Peer reviewed?
- Yes
Legacy Posted Date
2012-02-06Usage metrics
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