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Kilometer-range depth imaging at 1550 nm wavelength using an InGaAs/InP single-photon avalanche diode detector
journal contribution
posted on 2023-06-09, 13:34 authored by Aongus McCarthy, Ximing Ren, Adriano Della Frera, Nathan R Gemmell, Nils J Krichel, Carmelo Scarcella, Alessandro Ruggeri, Alberto Tosi, Gerald S BullerWe have used an InGaAs/InP single-photon avalanche diode detector module in conjunction with a time-of-flight depth imager operating at a wavelength of 1550 nm, to acquire centimeter resolution depth images of low signature objects at stand-off distances of up to one kilometer. The scenes of interest were scanned by the transceiver system using pulsed laser illumination with an average optical power of less than 600 µW and per-pixel acquisition times of between 0.5 ms and 20 ms. The fiber-pigtailed InGaAs/InP detector was Peltier-cooled and operated at a temperature of 230 K. This detector was used in electrically gated mode with a single-photon detection efficiency of about 26% at a dark count rate of 16 kilocounts per second. The system’s overall instrumental temporal response was 144 ps full width at half maximum. Measurements made in daylight on a number of target types at ranges of 325 m, 910 m, and 4.5 km are presented, along with an analysis of the depth resolution achieved.
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- Published
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- Published version
Journal
Optics ExpressISSN
1094-4087Publisher
Optical Society of AmericaExternal DOI
Issue
19Volume
21Page range
22098-22113Department affiliated with
- Engineering and Design Publications
Full text available
- Yes
Peer reviewed?
- Yes
Legacy Posted Date
2018-05-30First Open Access (FOA) Date
2018-05-31First Compliant Deposit (FCD) Date
2018-05-31Usage metrics
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