ZHAO+et+al_2019_J._Phys._D__Appl._Phys._10.1088_1361-6463_ab0d65.pdf (901.44 kB)
AlInP photodiode x-ray detectors
journal contribution
posted on 2023-06-09, 17:10 authored by Shifan Zhao, Silvia Butera, Grammatiki LioliouGrammatiki Lioliou, A B Krysa, Anna BarnettAnna BarnettFour Al0.52In0.48P p+-i-n+ mesa photodiodes with 6 µm thick i layers and two different diameters (217 µm??±??15 µm and 409 µm??±??28 µm) were studied at room temperature (24 °C). Electrical characterisation measurements are reported along with measurements showing the performance of the devices as x-ray detectors. The devices exhibited leakage currents??<3 pA (corresponding to leakage current densities??<2 nA cm-2) at 100 V reverse bias (electric field strength of 167?kV cm-1). The photodiodes were coupled to a custom-made low-noise charge-sensitive preamplifier, the noise characteristics of the resultant spectrometers were investigated as functions of shaping times. The best energy resolutions (full width at half maximum of the 5.9?keV photopeak from an 55Fe radioisotope x-ray source) achieved with the 217 µm??±??15 µm and 409 µm??±??28 µm diameter photodiodes were 0.89?keV and 1.05?keV, respectively. The dielectric dissipation factor of Al0.52In0.48P was estimated to be (2.2??±??1.1)??×??10-3 at room temperature.
Funding
Radioisotope Microbatteries; G1951; STFC-SCIENCE AND TECHNOLOGY FACILITIES COUNCIL; ST/P001815/1
2016 Philip Leverhulme Prize; Leverhulme Trust
Photon counting X-ray and gamma-ray spectroscopy with Al0.52In0.48P detectors; G2140; EPSRC-ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL; EP/P021271/1
History
Publication status
- Published
File Version
- Accepted version
Journal
Journal of Physics D: Applied PhysicsISSN
0022-3727Publisher
IOP PublishingExternal DOI
Issue
22Volume
52Article number
a225101Department affiliated with
- Engineering and Design Publications
Full text available
- Yes
Peer reviewed?
- Yes
Legacy Posted Date
2019-03-08First Open Access (FOA) Date
2020-03-06First Compliant Deposit (FCD) Date
2019-03-07Usage metrics
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